Synopsys teams for real-time data analytics in semiconductor test

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Continuing its move into semiconductor production tools, Synopsys is combining its Silicon Lifecycle Management platform with the latest ACS Nexus test system from Advantest. The newly launched ACS Nexus software enables real-time data streaming from distributed test floors across the semiconductor supply chain into the analytics software of customers and third…
By Nick Flaherty

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Continuing its move into semiconductor production tools, Synopsys is combining its Silicon Lifecycle Management platform with the latest ACS Nexus test system from Advantest.

新推出的ACS Nexus软件使真实的-time data streaming from distributed test floors across the semiconductor supply chain into the analytics software of customers and third parties for data analytics in Synopsys’ SiliconDash.

The software defined interface in ACS Nexus enables access to aggregated data streams of multiple test cells through a central, standardized software interface available on-premise and is tightly integrated into the V93000 and T2000 Advantest equipment platforms, expanding to all other Advantest platforms over the next year.

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The strategic deal is key to helping the semiconductor industry needs to realize the highest possible quality while achieving stable yield maximums as quickly as possible say the companies. Technologies like 5G, 3D/2.5D heterogenous packaging and IC design, and the increasing diversification of Application-Specific ICs (ASICs) necessitate increasingly innovative and software-driven approaches to semiconductor test.

The partnership means customers and partners now can access a single centrally provided interface to collect test data in a secure, reliable, and standardized way, with fine-grained permission control by the data owners. Expanding the existing data logging capabilities through the software-defined interface allows data analytics providers and customers alike to dramatically escalate their advanced analytics capabilities, quickly achieving the desired quality with the highest attainable yield.

This also reduces the significant burden of providing IT infrastructure for test data management from test floor operators, improving the security and reliability of test floor operations and thus overall equipment efficiency (OEE).

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